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Measurement
Differential Gaging: 2 Big Benefits for In-Process Part Control
Differential gaging offers benefits like reducing operator influence and enabling quick in-process checks.
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Lasers Ensure Perpendicularity, Improve Bearing Bore Quality
Hamar Laser’s laser scanners have enabled Hi-Tech Compressor and Pump Products to achieve consistent tolerance readings where dial indicators struggled.
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How to Improve Comparator Stand Performance for Gaging
Adding digital display systems and high-precision probes to comparator stands brings new functionality and pitfalls. The right setup can minimize errors.
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GOM Suite 2021 Features Faster Scans, Specialized Workflows
Capture 3D has released GOM Suite 2021, a consolidated ecosystem of GOM GmbH’s 3D metrology models that includes efficiency and capability upgrades.
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X-Ray Part Scanning as a Dimensional Measurement Process
Data-driven manufacturing gets a boost with a new class of x-ray inspection equipment that outputs a digital twin of a machined part, including complete 3D representations of internal and external dimensions.
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Heidenhain Touch Probe Offers High Speeds and 3D Accuracy
Heidenhain’s TS 760 touch probe offers 1 µm accuracy while keeping compatibility with the TS 740 and providing the same additional data as the TS 460.
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New Exair Model Measures, Identifies Sources of Static
Model 7905 Digital Static Meter measures surface voltage and polarity on objects up to ±20 kV from one inch (25 mm) away.
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How to Choose the Right Dial Indicator
Digital alternatives are replacing dial indicators – but dial indicators can still be useful. Here’s how to select the right one for a given application.
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Verisurf, Open X Develop New Metrology Training Course
Open X, Verisurf add CMM Programing and Inspection to the list of available training courses.
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Vision Engineering Launches Compact Digital Microscope
Vision Engineering’s VE Cam is a complete standalone inspection microscope for circuit board examination, printed circuit board debug activities or for discovering imperfections, and to trace problems in a wide range of industrial applications.
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